Small-Angle X-ray Scattering
Small-angle X-ray scattering (SAXS) for the measurement of particle size and membrane thickness
In SAXS, extremely low-angle X-rays scattered from a sample are detected, enabling the measurement of membrane thicknesses and particle sizes of the order of nanometers.
In our measurement device, which uses the MIRRORCLE-CV series synchrotron light source, characteristic X-rays can be produced by interchanging the target.
Analysis example ：
Mo target with Mo-Kα radiation (17.48 keV)
(Left) Reflectivity measurement of a vapor-deposited aluminum film (78.2 nm)
(Right) Reflectivity measurement of silicone
Analysis example : particle size determination of gold microparticles
| Light source | MIRRORCLE-CV1 |
| X-ray energy | 10〜25keV |
|
Measurement method
|
Angular dispersion or energy dispersion |
| Optical system | Triple-slit optical system |
| Sample configuration (film thickness measurement) | Film deposited onto a matrix by vaporization or other means |
| Sample configuration (particulate) | Powder |
| Sample size | Contact us |
| Mesurement renge |
Tens of nm〜 Hundreds of nm |