X-ray Fluorescence Analysis
X-ray fluorescence analysis of all elements with ppm precision
General X-ray fluorescence devices can only detect elements of atomic number up to 40 because of the low-energy X-ray used. Thus, large-scale synchrotrons, such as Spring-8, have been the only devices capable of analyzing heavy metals using X-ray fluorescence. With MIRRORCLE, X-ray fluorescence analysis of heavy metals can be easily performed; by selecting the target and varying the operational conditions, not only traces of light elements such as calcium, but also heavy elements such as lead can be detected.
Analysis example : examination of a tungsten sample
Fluorescent X-rays from tungsten sample (W) and lead shielding (Pb) are detected.
Analysis example : examination of wood flour
Fluorescent X-rays from minute metal contamination in the wood flour are detected.
| Light source | MIRRORCLE-CV1、CV4、6x |
| Measurement Energy range | 3〜100keV |
| Quantitative Analysis | Calibration curve method using standard samples |